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Faculty of Advanced Science and Technology, Kumamoto University

Molecular Engineering Laboratory

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Laboratory

Laboratory equipment

Arc-plasma method nanoparticle deposition system

APD system (ADVANCE RIKO)
アークプラズマナノ粒子形成装置

A new device for directly synthesis of metal nanoparticle or nanofilm by pulsed arc plasma deposition. In addition to the synthesis of highly dispersed, homogeneous and active sub nanoparticle catalyst, it is expected to synthesize new nanofilm catalyst with high TOF.

Devices for catalyst evaluation and analysis

BEL-METAL, BELCAT-A, BELCAT-B, BALCAT II (MicrotracBEL)
触媒評価・触媒分析装置

Instruments for characterization of catalysts for determining the acidity/basicity (TPD), the metal dispersion, the redox behavior (TPO/TPR) and evaluation of catalytic reaction. Low temperature measurement using cryo unit and simultaneous analysis of multi components using Q-mass spectrometer are also possible.

X-ray diffraction (XRD)

Multiflex, RINT, Ultima IV (Rigaku)
X線回折装置(XRD)

Devices for the crystal structure of powder and film samples by X-ray diffraction method, which identify the crystal phase when the lattice spacing of the crystal satisfies the Bragg condition. Small angle measurement is also possible.

High speed and automatic X-ray photoelectron spectrometer (XPS) system

K-Alpha (Thermo Fischer Scientific)
高速全自動X線光電子分光装置(XPS)

An instrument for analysis of the photoelectron energy emitted from the solid surface by X-ray excitation in order to investigate the surface composition and/or chemical state of surface metals. Depth information of a few nanometers from the surface can be obtained.

BET surface area, pore size distribution

BELSORP-mini, BELSORP-18 (MicrotracBEL)
比表面積・細孔分布測定装置

Instruments for the measurement of gas adsorption/desorption isotherms. Specific surface area (BET method) and pore size distribution (BJH method) can be measured.

Energy/Length dispersive X-ray fluorescence spectrometry (XRF)

EDXL300, Supermini200 (Rigaku)
エネルギー/波長分散型蛍光X線分析装置(XRF)

Instruments for elemental analysis by the energy and intensity of X-ray fluorescence generated from a sample by X-ray irradiation.

Common equipment

Under construction.

Others

Under construction.